SynTest Technologies, Inc.


SynTest Technologies, Inc. was founded in January 1990 to develop and market technologically advanced test solutions for the electronics industry. The company shipped its first product in August 1991 and has maintained consistent growth and profitability every year since then. In addition to product sales, SynTest has established close partnerships with its customers to perform consulting services for specific designs, and to implement joint development projects based on customer specifications. SynTest's unique position as an independent test company allows great flexibility in applying its expertise to meet customer requirements. SynTest is managed by a team that combines over 100+ years in Computer-Aided-Test (CAT) experience, and that has published over 30 technical papers on the subject.
Such experience results in the proven ability to provide exceptional customer support and deliver technologically advan
ced products.




Product Name: DFT-PRO Plus
Product Category: Design for Test - ASIC and IC Design

DFT-PRO Plus ™ offers an integrated DFT solution covering scan synthesis and ATPG, memory Built-In Self-Test (BIST) synthesis and boundaryscan (BSD) synthesis. The corresponding tools generate RTL blocks that fit seamlessly into an existing synthesis flow.

Product Name: TurboBIST-Logic
Product Category: Design for Test - ASIC and IC Design

TurboBIST™ family of products from SynTest Technologies, Inc. includes tools for logic (TurboBIST™ - Logic) and memory (TurboBIST™ - Memory) (SRAM, ROM, DRAM and CAM) built-in self-test. These tools synthesize the BIST logic surrounding functional logic and memory blocks, inc

Product Name: TurboBIST-Memory
Product Category: Design for Test - ASIC and IC Design

The TurboBIST-Memory family of products from SynTest Technologies, Inc., includes tools for adding highly efficient BIST structures to all types of embedded memories including SRAMs, ROMs, SDRAMs and CAMs.

Product Name: TurboBSD
Product Category: Design for Test - ASIC and IC Design

TurboBSD is a high performance boundary scan design suite that makes boundary scan design a fast and straightforward process. It synthesizes boundary scan cells, the TAP controller and instruction registers.

Product Name: TurboCheck
Product Category: Design for Test - ASIC and IC Design

SynTest offers two versions of TurboCheck – TurboCheck- RTL™ and TurboCheck-Gate™ – to support different levels of checking throughout the design cycle. With TurboCheck-RTL, designers can very quickly identify testability problems at the earliest stages of the design cycle, even before the often time-consuming logic synthesis process.

Product Name: TurboDFT
Product Category: Design for Test - ASIC and IC Design

TurboDFT contains a suite of very useful and powerful DFT integration tools. TurboDFT allows users to automatically integrate and stitch DFT cores, whether they are created using DFT tools from SynTest or other vendors.

Product Name: TurboFault
Product Category: Design for Test - ASIC and IC Design

TurboFault™ combines high performance, versatility and accuracy. It is highly competitive with hardware accelerators for classical test fault grading. It supports synchronous and asynchronous designs at the gate level, including tri-state gates, latches, flip-flops, single and multi-port RAMs, complex bus resolution functions, and User Defined Primitives (UDPs).

Product Name: VirtualScan
Product Category: Design for Test - ASIC and IC Design

VirtualScan™ is SynTest's solution to combat this increase in test data volume and test cycle volume. With VirtualScan™ an extremely large number of short scan chains within the SOC can be virtually accessed from outside the chip with a limited number of pins assigned as scan pins.


505 South Pastoria Avenue
Suite 101
Sunnyvale, CA 94086
United States
Phone: 408-720-9956
Fax: 408-720-9960
Contact us
Url: http://www.syntest.com


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