Anchor Semiconductor, Inc.
Anchor is a pioneer and a worldwide leader in the
semiconductor hotspot pattern management and analysis, supplying foundries and
design houses with a suite of software solutions to improve IC manufacturing
efficiency and chip yield. Under the innovative pattern-centric NanoScope
platform, Anchor helps resolving the rapidly increasing challenges of analyzing
and managing significant volumes of CD metrology data from IC fab, determining
process critical design patterns and optimizes fab processes.
Hotspot Pattern Analyzer provides powerful solutions for
analysis and dispositioning of different types of violations found from
design verification to manufacturing process characterization and
monitoring. Integrated in NanoScope™ pattern-centric DFM platform, the
hotspot analyzer takes hotspot reports from tools such as OPC
verification or layout process sensitivity checking, as well as
hotspots detected in manufacturing.
NanoScope-DFP is manufacturing-aware design verification tool. It is used at pre-tapeout design stage and complementary to DRC to ensure lithographic-friendly layout. Please contact Anchor specialists for more information.
(Defect Pattern Library) is built on Anchor’s pattern-centric NanoScope platform. DPL provides patterning knowledge sharing and reuse, allows users to save patterns from different sources: litho-unfriendly patterns in OPC verification, problematic patterns in mask making, and yield limiting patterns in wafer printing.
NanoScope-PRV (PRV) is a market-leading OPC/RET inspection tool. It is a software-based solution which has superior advantages in full-chip accuracy and performance. Together with its unparalleled analysis capability and ease-of-use, PRV provides our customers the fastest ROI and lowest COO (cost of ownership). It is silicon-proven at 0.15um, 0.13um, 0.11um, 90nm and below. It has successfully helped many of our customers around the world to cut down their OPC/RET development cycle time and avoid the costly mask making and wafer fabrication.