Advantest Technology Solutions Corp.

Advantest America is the North American subsidiary of Advantest Corporation, the world’s largest provider of automatic test equipment (ATE) to the semiconductor industry. ATE is used during semiconductor manufacturing to verify that a chip functions to specification, ensuring it works in the end-use application – be it consumer electronics, telecommunications, medical instrumentation or computers and digital TVs, to name a few. Advantest has for over five decades led the way in developing new and innovative test and handling solutions for the global electronics industry. For the fiscal year ending March 31, 2013, Advantest reported year-end revenue of ¥132.9 billion, or US$1.7billion.

Product Name: Announced SoC devices for test handler "M4871"
Product Category: PCB Design and Analysis - PCB Design Tools

Provides test solutions efficient and flexible in Advanced SoC device temperature control technology and handling precision of industry-leading

Advantest Corporation (Head Office: Chiyoda-ku, Tokyo, President: Haruo Matsuno) today announced new product of SoC (System-on-Chip) device for test handler "M4871". Be corrected with high precision image processing contact the positional accuracy of the device under test to the "double-sided visual alignment" function, which allows high accuracy to the device under test, the application of high temperature response This product, "Active Thermal Control" , and such as the ability to monitor in real time the test situation through the network have been added to the new. In addition, it provides a test solution for high-quality, high-efficiency for Advanced SoC devices by using in conjunction with the device interface and test our systems, miniaturization and high functionality proceeds.

Product Name: The announcement of the new module T2000 IC for automotive and power management
Product Category: Power Grid Analysis - ASIC and IC Design

I realize a low-cost work efficiency and excellent in the industry a further large number of simultaneous measurement

Advantest Corporation (Head Office: Chiyoda-ku, Tokyo, President Haruo Matsuno), new module "T2000" Integral power device test solution (IPS) "GVI64" (64ch General purpose voltage-current (VI) module) I announced. In parametric test of automotive multi-pin IC and power control, "GVI64" is to achieve cost-of-test with excellent industry. Power management circuit, power amplifier, such as D / A converter and A / D converter is integrated into one chip, for high density multi-function analog devices, it provides a simultaneous test a large number and wide range of coverage.

Product Name: The latest development MASK MVM-SEM ® of 1Xnm node corresponding "E3640"
Product Category: Yield & Statistical Optimization - ASIC and IC Design

Advantest Corporation (Head Office: Chiyoda-ku, Tokyo, President Matsuno Haruo), can be measured with high precision fine pattern dimensions of the patterned media and mask by using an electron beam scanning technology of its own, the latest MASK MVM-SEM (Multi We will start selling multi-dimensional observation and measurement scanning electron microscope) of "E3640": Vision Metrology Scanning Electron Microscope.

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