Stratosphere Solutions, Inc.

Stratosphere Solutions is a global leading provider of solutions that drive parametric yield higher. We built our strong technical reputation by partnering with our early adopter customers to generate massive amount of parametric data from early silicon at each technology node at a very low cost, develop pioneering solutions for modeling variability and analyzing impact of variability on a designs statistical performance. Our tools have been adopted by leading foundry, IDMs, and fab-lite companies making them defacto standards of industry.

Product Name: StratoPro™
Product Category: Intellectual Property (IP) - ASIC and IC Design

StratoPro™ is the industry’s leading statistical process variability characterization solution. The combination of its Parametric ActiveMatrix silicon IP platform and analysis methods enable engineers to gather high resolution statistics on key process parameters to characterize within-die variations. Its scalable architecture allows customers to use it in process technology development and production environment. Appropriate positioning of StratoPro on the reticle provides variations statistics across the wafer, across the reticle, across the die and within the die. The high density architecture reduces silicon cost while accelerated test reduces test cost. The high resolution affords measurement of subtle shifts in process parameters. Ability to support complex test devices in StratoPro allows engineers to perform context-dependant modeling. StratoPro is the most cost-effective, accurate and silicon-proven solution for characterizing process variations from 130nm to 45nm in the market today.

440 N. Wolfe Road
Sunnyvale, CA 94085
United States
Phone: 408-215-0074
Fax: 408-744-0121
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