Stratosphere Solutions, Inc.
Stratosphere Solutions is a global leading provider of solutions that drive parametric yield higher. We built our strong technical reputation by partnering with our early adopter customers to generate massive amount of parametric data from early silicon at each technology node at a very low cost, develop pioneering solutions for modeling variability and analyzing impact of variability on a designs statistical performance. Our tools have been adopted by leading foundry, IDMs, and fab-lite companies making them defacto standards of industry.
StratoPro™ is the industry’s leading statistical
process variability characterization solution. The combination
of its Parametric ActiveMatrix silicon IP platform and analysis
methods enable engineers to gather high resolution statistics
on key process parameters to characterize within-die variations.
Its scalable architecture allows customers to use it in process
technology development and production environment. Appropriate
positioning of StratoPro on the reticle provides variations
statistics across the wafer, across the reticle, across the
die and within the die. The high density architecture reduces
silicon cost while accelerated test reduces test cost. The
high resolution affords measurement of subtle shifts in process
parameters. Ability to support complex test devices in StratoPro
allows engineers to perform context-dependant modeling. StratoPro
is the most cost-effective, accurate and silicon-proven solution
for characterizing process variations from 130nm to 45nm in
the market today.
